Design for Testability
Implementing robust testing strategies to ensure high-quality, fault-free designs.
Design For Test (DFT) Services are essential to ensure that your semiconductor designs are easily testable and manufacturable. DFT strategies help detect faults during production, improving yield and reliability.
At MinanoSpace, our DFT team implements scan chains, boundary-scan, and built-in self-test (BIST) methodologies to maximize test coverage without compromising design performance or area.
By integrating advanced DFT techniques early in the design flow, we reduce time-to-market, enhance product quality, and minimize costly post-silicon debug cycles. Our expertise ensures your chips meet rigorous industry standards.
Implement robust DFT strategies to achieve comprehensive fault detection and reliable testing across all modules.
Integrate DFT structures early in the design cycle to minimize delays and avoid late-stage modifications.
Leverage advanced test methodologies to maximize production yield and ensure high-quality deliverables.
DFT is a critical component of semiconductor design, ensuring that every chip can be effectively tested and validated before mass production. Without proper DFT, faults may go undetected, leading to product failures and costly rework.
MinanoSpace focuses on efficient and optimized DFT implementation, combining technical expertise with advanced tools. By providing high-quality, testable designs, we help clients achieve faster time-to-market, higher yields, and more reliable products.
Ensure chips are fully testable, reducing undetected faults.
Early DFT integration accelerates validation and manufacturing processes.
Optimize design for maximum production yield and reliable performance.
Explore how MinanoSpace has helped clients optimize testing efficiency, improve yield, and accelerate their design-to-silicon journey.
Reduced test time by 40% using customized scan chain insertion and ATPG pattern tuning, resulting in faster production and improved validation throughput.
Achieved a 25% reduction in power consumption during test cycles through innovative clock gating and pattern optimization strategies.
Reduced verification time by 35% with automated BIST insertion and fault coverage analysis across multiple memory instances.